Overview
The Perfect Inline Analysis Solution
With in-line analysis, results are provided every few seconds which allows for timely adjustments for improved process efficiency which can maximize profits. ProFoss™ 2 also allows you to fine-tune control parameters such as water dosage to achieve desired product results for both sucrose extraction and energy potential in the bagasse. Designed to be simple to use, ProFoss™ 2 is delivered ready to use with calibrations for all key parameters and FossManager™ networking software.
Parameters
Sample Type
Technology
Easy Maintenance
Measurements are based on the latest in NIR reflectance technology for process applications including a robust sensor with a double window system. The first window showcasing the inside of the process pipe remains while the second can be removed for easy maintenance on the sensor without interrupting the process operations.
Performance validation
Registering and measuring samples by the ProFoss 2 and a bench top analyser (FoodScan 2 or NIRS DS3) reduces the risk of error and secure optimal performance. Using integration, connectivity and automation the results matched are saved via cloud and are ready for evaluation and reporting using digital services
Trend Analysis
ProFoss™ 2 allows you to do direct measurements in the process line, thereby effectively avoiding sampling errors and sample preparation errors. The results are shown in an intuitive graphical display, making it easy to spot variations. Because ProFoss™ 2 is measuring every few seconds it gives a reliable picture of what is going on in the process.
High resolution near infrared technology
High resolution diode array technology ensures accurate and continuous analysis, giving you a clearer picture of your process. A high number of pixels (diode sensors) in the spectrum secures a more detailed (accurate) and uniform (repeatable) analysis result
See it in Action
Performance Data
| Measurement mode | Reflectance |
| Analysis Frequency | Real time: Average analysis time per result 2 – 3 seconds |
| Wavelength range | 1100 – 1650 nm |
| Detector | InGaAs Diode Array |
| Spectral dispersion | 1.1 nm / pixel |
| General | |
| Technology | NIR Technology |
| Software package | ISIscan™ NOVA for instrument control |
| Wavelength accuracy | <0.5 nm |
| Wavelength precision | < 0.02 nm |
| Wavelength stability | < 0.01 nm/°C |
| Noise | < 60 micro AU |
| IP69 is the highest protection for dust entering the unit. IP69 means protected against the effect of high-pressure water and/or steam cleaning high temperature | |